Weights Device Under Test Sequential Test Generation Deterministic Test Sequences Weight Generation Weighted Random Sequences
نویسنده
چکیده
We present a method for testing sequential circuits using weighted random sequences. The weights are stored and a weighted random sequence generator is used to produce the required test sequences during testing rather than storing the actual test sequences themselves. The generation of required weights is based on the dynamic scan algorithm, DYNASTEE. Experimental results demonstrate new tradeoos in test application time and in tester memory requirements, while maintaining 100% fault coverage of all target faults.
منابع مشابه
Array of Weights Device Under Test Sequential Test Generation Deterministic Test Sequences Weight Generation Weighted Random Sequences Pin Programmable Tester
We present a method for testing sequential circuits using weighted random sequences. The weights are stored and a weighted random sequence generator is used to produce the required test sequences during testing rather than storing the actual test sequences themselves. The generation of required weights is based on the dynamic scan algorithm, DYNASTEE. Experimental results demonstrate new tradeo...
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تاریخ انتشار 2004